QUALITY CONTROL

EQUIPMENT


Used for:

Low-E layer sheet resistance and glass emissivity measurement, low-E layer thickness measurement.

 

Application:

Architectural low E glass

Smart-glass applications

Photovoltaics, …

 

Principle of operation:
  • gives sheet resistance (Ohm/sq)
  • metal layer thickness (nm, µm)
  • metal substrate thickness (µm)    

 

Features contact free, also available in-line: for glass coaters: to check the quality of the coating after the coating process. For glass temperers: to check the quality of the coating after tempering process.

 

Technical characteristics:
  • Non contact eddy current sensor
  • Max sample thickness : 1-25mm
  • Sheet resistance range: three ranges going from 0.0001 to 100,000 Ohm/sq
  • thickness measurement range: 2nm-2mm
  • dimensions: 290x140x445 mm; 10kg


Option:

Inline version

ON LINE

for architectural glass temperers who buy a ready-coated glass: to check the quality of the in-coming glass coating.

 


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