QUALITY CONTROL
EQUIPMENT
Used for:
Low-E layer sheet resistance and glass emissivity measurement, low-E layer thickness measurement
Application:
Architectural low E glass
Smart-glass applications
Photovoltaics, …
Principle of operation:
Real time and easy to use, set the analyser on the glass sample and push a button.
Features:
Hand held instrument, easy to use on already installed glass
Technical characteristics:
Eddy current sensor
Measurement spot : 40mm diameter
sheet resistance range: five ranges going from 0.001 to 100 Ohm/sq
Thickness measurement range: 5nm-500µm
